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Application Note 1450
TABLE 2. TEST POINT DESCRIPTIONS
You can observe the D- and D+ USB signal of the
High-Speed Channel 1 on an oscilloscope or other test
DESIGNATOR
TP1
TP2
TP3
TP5
TP6
JP1
JP2
JP3
DESCRIPTION
V DD test point
Ground Test Point
OE Test Point
SEL Test Point
V BUS from Pin 1 of Connector J5 Test Point
D-/D+ Differential Probe Connection - COM Side of
Switch
D-/D+ Differential Probe Connection - Device
1Side of Switch
D-/D+ Differential Probe Connection - Device
equipment by connecting a differential probe at JP2.
You can observe the D- and D+ USB signal of the
High-Speed Channel 2 on an oscilloscope or other test
equipment by connecting a differential probe at JP3.
You can observe the D- and D+ USB signal at the COM side
of the switch on an oscilloscope or other test equipment by
connecting a differential probe at JP1.
2Side of Switch
ISL54222AIRUEVAL1Z Board Schematic
SEL
VDD
GND
OE
TP5
J4
J1
J2
J3
TP3
1
TP1
1
1
C1
10UF
C2
0.1UF
1
TP2
1
1
A
5 MOUNT
1
2
3
4
USB
TO
DEVICE1
1
3
2
4 JP2
6
A
MOUNT
J6
A
1 1
2 2
U1
UTQFN10
7 7
6 6
A
5 MOUNT
1
2
3
USB
1
3
2
4 JP3
4
6
MOUNT
TO
DEVICE2
DIFFPROBE
A
TP6
1
A
1 JP4 2
A
A
J7
A
2
1
1
2
JP5
USB
5
6
897-30-004-90-000
3 4
J8
VBUSCH1
J9
VBUSCH2
J5 HOST
USB
TO
A
A
Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without notice. Accordingly, the reader is cautioned to
verify that the Application Note or Technical Brief is current before proceeding.
For information regarding Intersil Corporation and its products, see www.intersil.com
5
AN1450.1
July 24, 2009
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